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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:045879/0763   Pages: 5
Recorded: 05/23/2018
Attorney Dkt #:15067.10
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 29
1
Patent #:
6420722
Issue Dt:
07/16/2002
Application #:
09863571
Filing Dt:
05/23/2001
Publication #:
US20010045511
Pub Dt:
11/29/2001
Title:
METHOD FOR SAMPLE SEPARATION AND LIFT-OUT WITH ONE CUT
2
Patent #:
6841788
Issue Dt:
01/11/2005
Application #:
09920715
Filing Dt:
08/03/2001
Title:
TRANSMISSION ELECTRON MICROSCOPE SAMPLE PREPARATION
3
Patent #:
6570170
Issue Dt:
05/27/2003
Application #:
10085968
Filing Dt:
02/28/2002
Publication #:
US20020121614
Pub Dt:
09/05/2002
Title:
TOTAL RELEASE METHOD FOR SAMPLE EXTRACTION FROM A CHARGED-PARTICLE INSTRUMENT
4
Patent #:
6777674
Issue Dt:
08/17/2004
Application #:
10252659
Filing Dt:
09/23/2002
Publication #:
US20040056194
Pub Dt:
03/25/2004
Title:
METHOD FOR MANIPULATING MICROSCOPIC PARTICLES AND ANALYZING
5
Patent #:
6927400
Issue Dt:
08/09/2005
Application #:
10801477
Filing Dt:
03/12/2004
Publication #:
US20040178355
Pub Dt:
09/16/2004
Title:
SAMPLE MANIPULATION SYSTEM
6
Patent #:
6995380
Issue Dt:
02/07/2006
Application #:
10801521
Filing Dt:
03/12/2004
Publication #:
US20040178372
Pub Dt:
09/16/2004
Title:
END EFFECTOR FOR SUPPORTING A MICROSAMPLE
7
Patent #:
6982429
Issue Dt:
01/03/2006
Application #:
10886201
Filing Dt:
07/06/2004
Publication #:
US20040245466
Pub Dt:
12/09/2004
Title:
TRANSMISSION ELECTRON MICROSCOPE SAMPLE PREPARATION
8
Patent #:
7395727
Issue Dt:
07/08/2008
Application #:
11186072
Filing Dt:
07/21/2005
Publication #:
US20070089528
Pub Dt:
04/26/2007
Title:
STRAIN DETECTION FOR AUTOMATED NANO-MANIPULATION
9
Patent #:
7381971
Issue Dt:
06/03/2008
Application #:
11186073
Filing Dt:
07/21/2005
Publication #:
US20060022135
Pub Dt:
02/02/2006
Title:
METHOD AND APPARATUS FOR IN-SITU PROBE TIP REPLACEMENT INSIDE A CHARGED PARTICLE BEAM MICROSCOPE
10
Patent #:
7414252
Issue Dt:
08/19/2008
Application #:
11265934
Filing Dt:
11/03/2005
Publication #:
US20060091325
Pub Dt:
05/04/2006
Title:
METHOD AND APPARATUS FOR THE AUTOMATED PROCESS OF IN-SITU LIFT-OUT
11
Patent #:
7208724
Issue Dt:
04/24/2007
Application #:
11266678
Filing Dt:
11/03/2005
Publication #:
US20060091302
Pub Dt:
05/04/2006
Title:
APPARATUS AND METHOD OF DETECTING PROBE TIP CONTACT WITH A SURFACE
12
Patent #:
7315023
Issue Dt:
01/01/2008
Application #:
11334929
Filing Dt:
01/19/2006
Publication #:
US20060113476
Pub Dt:
06/01/2006
Title:
METHOD OF PREPARING A SAMPLE FOR EXAMINATION IN A TEM
13
Patent #:
7644637
Issue Dt:
01/12/2010
Application #:
11860663
Filing Dt:
09/25/2007
Publication #:
US20090078060
Pub Dt:
03/26/2009
Title:
METHOD AND APPARATUS FOR TRANSFER OF SAMPLES IN A CONTROLLED ENVIRONMENT
14
Patent #:
7834315
Issue Dt:
11/16/2010
Application #:
12041217
Filing Dt:
03/03/2008
Publication #:
US20080258056
Pub Dt:
10/23/2008
Title:
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT
15
Patent #:
8288740
Issue Dt:
10/16/2012
Application #:
12163290
Filing Dt:
06/27/2008
Publication #:
US20090320624
Pub Dt:
12/31/2009
Title:
METHOD FOR PREPARING SPECIMENS FOR ATOM PROBE ANALYSIS AND SPECIMEN ASSEMBLIES MADE THEREBY
16
Patent #:
7961397
Issue Dt:
06/14/2011
Application #:
12201447
Filing Dt:
08/29/2008
Publication #:
US20100051802
Pub Dt:
03/04/2010
Title:
SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSCOPES
17
Patent #:
7935937
Issue Dt:
05/03/2011
Application #:
12391552
Filing Dt:
02/24/2009
Publication #:
US20090294690
Pub Dt:
12/03/2009
Title:
METHOD OF FORMING TEM SAMPLE HOLDER
18
Patent #:
8394454
Issue Dt:
03/12/2013
Application #:
12399579
Filing Dt:
03/06/2009
Publication #:
US20090223451
Pub Dt:
09/10/2009
Title:
METHOD AND APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION BEAM INSTRUMENTS
19
Patent #:
8054558
Issue Dt:
11/08/2011
Application #:
12701071
Filing Dt:
02/05/2010
Publication #:
US20100202042
Pub Dt:
08/12/2010
Title:
MULTIPLE MAGNIFICATION OPTICAL SYSTEM WITH SINGLE OBJECTIVE LENS
20
Patent #:
8227781
Issue Dt:
07/24/2012
Application #:
12842105
Filing Dt:
07/23/2010
Publication #:
US20110017927
Pub Dt:
01/27/2011
Title:
VARIABLE-TILT SPECIMEN HOLDER AND METHOD AND FOR MONITORING MILLING IN A CHARGED-PARTICLE INSTRUMENT
21
Patent #:
8168949
Issue Dt:
05/01/2012
Application #:
12896274
Filing Dt:
10/01/2010
Publication #:
US20110031396
Pub Dt:
02/10/2011
Title:
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT
22
Patent #:
8247768
Issue Dt:
08/21/2012
Application #:
12896281
Filing Dt:
10/01/2010
Publication #:
US20110031397
Pub Dt:
02/10/2011
Title:
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT
23
Patent #:
8440969
Issue Dt:
05/14/2013
Application #:
13196240
Filing Dt:
08/02/2011
Publication #:
US20120025075
Pub Dt:
02/02/2012
Title:
METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPTICAL AND CHARGED PARTICLE BEAM IMAGES
24
Patent #:
8512474
Issue Dt:
08/20/2013
Application #:
13357741
Filing Dt:
01/25/2012
Publication #:
US20130025536
Pub Dt:
01/31/2013
Title:
APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION BEAM INSTRUMENTS
25
Patent #:
8513622
Issue Dt:
08/20/2013
Application #:
13439346
Filing Dt:
04/04/2012
Publication #:
US20130091875
Pub Dt:
04/18/2013
Title:
METHOD FOR EXTRACTING FROZEN SPECIMENS AND MANUFACTURE OF SPECIMEN ASSEMBLIES
26
Patent #:
8759765
Issue Dt:
06/24/2014
Application #:
13567487
Filing Dt:
08/06/2012
Publication #:
US20130037713
Pub Dt:
02/14/2013
Title:
METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR
27
Patent #:
9097625
Issue Dt:
08/04/2015
Application #:
13864362
Filing Dt:
04/17/2013
Publication #:
US20140014742
Pub Dt:
01/16/2014
Title:
GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS
28
Patent #:
9349573
Issue Dt:
05/24/2016
Application #:
14797087
Filing Dt:
07/11/2015
Publication #:
US20160035540
Pub Dt:
02/04/2016
Title:
TOTAL RELEASE METHOD FOR SAMPLE EXTRACTION IN AN ENERGETIC-BEAM INSTRUMENT
29
Patent #:
NONE
Issue Dt:
Application #:
14926648
Filing Dt:
10/29/2015
Publication #:
US20160189929
Pub Dt:
06/30/2016
Title:
RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING
Assignor
1
OMNIPROBE, INC.
Exec Dt:
03/28/2018
Assignee
1
OXFORD INSTRUMENTS AMERICA, INC.
300 BAKER AVE.
SUITE 150
CONCORD, MASSACHUSETTS 01742
Correspondence name and address
JOHN A. THOMAS
14801 QUORUM DRIVE
SUITE 500
DALLAS, TX 75254

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