Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 011441/0769 | |
| Pages: | 3 |
| | Recorded: | 01/08/2001 | | |
Conveyance: | CORRECTED COVER SHEET TO CORRECT FIFTH ASSIGNOR'S NAME AS RECORDED AT REEL/FRAME 011181/0994 |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
03/06/2001
|
Application #:
|
09108439
|
Filing Dt:
|
07/01/1998
|
Title:
|
DETERMINATION OF THE THICKNESS OF A DENUDED ZONE IN A SILICON WAFER
|
|
Assignee
|
|
|
VIA C. OLIVETTI, 2 |
20041 AGRATE BRIANZA, ITALY |
|
Correspondence name and address
|
|
ALLEN DYER DOPPELT MILBRATH ET AL.
|
|
CHRISTOPHER F. REGAN, ESQ.
|
|
255 S. ORANGE AVE.
|
|
P.O. BOX 3791
|
|
ORLANDO, FL 32802
|
Search Results as of:
06/16/2024 02:09 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|