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Patent Assignment Details
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Reel/Frame:044882/0771   Pages: 11
Recorded: 12/15/2017
Conveyance: CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Total properties: 2
1
Patent #:
Issue Dt:
11/14/2017
Application #:
14350135
Filing Dt:
04/07/2014
Publication #:
Pub Dt:
09/25/2014
Title:
DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR MATERIALS
2
Patent #:
Issue Dt:
07/12/2016
Application #:
14350978
Filing Dt:
04/10/2014
Publication #:
Pub Dt:
09/18/2014
Title:
DARK-FIELD SEMICONDUCTOR WAFER INSPECTION DEVICE
Assignor
1
Exec Dt:
08/12/2016
Assignee
1
611 RUE ARISTIDE BERGES
MONTBONNOT-SAINT-MARTIN, FRANCE 38330
Correspondence name and address
TRASK BRITT, P.C.
P.O. BOX 2550
SALT LAKE CITY, UT 84110

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