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Reel/Frame:034829/0775   Pages: 2
Recorded: 01/28/2015
Attorney Dkt #:15701URS
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
14607352
Filing Dt:
01/28/2015
Publication #:
Pub Dt:
07/28/2016
Title:
Methodology Of Incorporating Wafer Physical Measurement With Digital Simulation For Improving Semiconductor Device Fabrication
Assignors
1
Exec Dt:
01/28/2015
2
Exec Dt:
01/28/2015
Assignee
1
5F-1, NO. 100, SEC. 1, JIAFENG 11TH RD.
ZHUBEI CITY
HSINCHU COUNTY, TAIWAN
Correspondence name and address
JASON Z. LIN
PO BOX 2339
SARATOGA, CA 95070-0339

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