Patent Assignment Details
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Reel/Frame: | 030808/0780 | |
| Pages: | 4 |
| | Recorded: | 07/16/2013 | | |
Attorney Dkt #: | P3977-KLAP102US |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/12/2016
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Application #:
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13840329
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Filing Dt:
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03/15/2013
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Publication #:
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Pub Dt:
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09/18/2014
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Title:
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SYSTEM AND METHOD TO DETERMINE DEPTH FOR OPTICAL WAFER INSPECTION
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Assignee
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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CHESTER PAUL MALISZEWSKI
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5555 MAIN STREET
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KLA-TENCOR CORPORATION AND SIMPSON & SIM
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WILLIAMSVILLE, NY 14221
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