Patent Assignment Details
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| Reel/Frame: | 020326/0781 | |
| Pages: | 4 |
| | Recorded: | 01/07/2008 | | |
| Attorney Dkt #: | QIM 2007 VJ 32715 US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11874768
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Filing Dt:
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10/18/2007
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Publication #:
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Pub Dt:
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04/23/2009
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Title:
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Method of Testing an Integrated Circuit, Method of Manufacturing an Integrated Circuit, and Integrated Circuit
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Assignees
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| GUSTAV-HEINEMANN-RING 212 |
| MUNICH, GERMANY 81739 |
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| 224 BLD. JOHN KENNEDY |
| CORBEIL ESSONNES CEDEX, FRANCE ZIP 31 P 91105 |
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Correspondence name and address
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SLATER & MATSIL, L.L.P
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17950 PRESTON RD.
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SUITE 1000
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DALLAS, TX 75252
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