Patent Assignment Details
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Reel/Frame: | 006844/0791 | |
| Pages: | 2 |
| | Recorded: | 12/20/1993 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/04/1996
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Application #:
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08142591
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Filing Dt:
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10/22/1993
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Title:
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METHOD AND APPARATUS FOR MEASURING THE CURVATURE OF WAFERS WITH A LASE R SOURCE SELECTING DEVICE
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Assignee
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23271 PATRIDGE LANE |
LOS ALTOS, CALIFORNIA 94024 |
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Correspondence name and address
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HICKMAN & BEYER
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PAUL L. HICKMAN
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P.O. BOX 61059
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PALO ALTO, CA 94306
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