Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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Reel/Frame: | 036427/0797 | |
| Pages: | 3 |
| | Recorded: | 08/26/2015 | | |
Attorney Dkt #: | TRANSFER DOCS |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
4
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Patent #:
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Issue Dt:
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11/11/2003
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Application #:
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09872752
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Filing Dt:
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06/01/2001
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Title:
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RADIOMETRIC TEMPERATURE MEASUREMENT SYSTEM
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Patent #:
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Issue Dt:
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11/09/2004
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Application #:
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10053483
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Filing Dt:
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11/02/2001
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Title:
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METHOD OF OPTICAL PYROMETRY THAT IS INDEPENDENT OF EMISSIVITY AND RADIATION TRANSMISSION LOSSES
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Patent #:
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Issue Dt:
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09/28/2004
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Application #:
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10197230
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Filing Dt:
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07/16/2002
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Publication #:
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Pub Dt:
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02/13/2003
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Title:
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WAFER TEMPERATURE MEASUREMENT METHOD FOR PLASMA ENVIRONMENTS
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Patent #:
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Issue Dt:
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03/01/2005
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Application #:
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10682259
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Filing Dt:
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10/08/2003
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Title:
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RADIOMETRIC TEMPERATURE MEASUREMENT SYSTEM
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Assignee
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100 PARK AVENUE |
FLORHAM PARK, NEW JERSEY 07932 |
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Correspondence name and address
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BASF CORPORATION
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100 PARK AVENUE
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FLORHAM PARK, NJ 07932
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