Patent Assignment Details
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| Reel/Frame: | 010426/0798 | |
| Pages: | 4 |
| | Recorded: | 12/08/1999 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/16/2003
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Application #:
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09414388
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Filing Dt:
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10/07/1999
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Title:
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SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING THIN FILM LAYER THICKNESS, REFLECTIVITY, ROUGHNESS, SURFACE PROFILE AND MAGNETIC PATTERN IN THIN FILM MAGNETIC DISKS AND SILICON WAFERS
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Assignee
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| SUITE 104D |
| 48890 MILMONT DRIVE |
| FREMONT, CALIFORNIA 94538 |
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Correspondence name and address
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FENWICK & WEST LLP
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JOHN T. MCNELIS
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2 PALO ALTO SQUARE
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PALO ALTO, CA 94306
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