Total properties:
38
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Patent #:
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Issue Dt:
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08/10/1982
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Application #:
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06186923
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Filing Dt:
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09/12/1980
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Title:
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SCANNING TUNNELING MICROSCOPE
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Patent #:
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Issue Dt:
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08/12/1986
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Application #:
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06505533
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Filing Dt:
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06/17/1983
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Title:
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HIGH-PERFORMANCE VIBRATION FILTER
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Patent #:
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Issue Dt:
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08/05/1986
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Application #:
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06563722
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Filing Dt:
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12/20/1983
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Title:
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OPTICAL NEAR-FIELD SCANNING MICROSCOPE
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Patent #:
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Issue Dt:
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05/31/1988
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Application #:
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06858320
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Filing Dt:
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04/30/1986
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Title:
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SCANNING THERMAL PROFILER
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Patent #:
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Issue Dt:
|
03/13/1990
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Application #:
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07256352
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Filing Dt:
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10/11/1988
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Title:
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LOADING MECHANISM AND SUPPORT STRUCTURE HAVING IMPROVED VIBRATION DAMPING USEFUL IN SCANNING TUNNELING MICROSCOPY
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Patent #:
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Issue Dt:
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10/16/1990
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Application #:
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07273354
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Filing Dt:
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11/16/1988
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Title:
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ATOMIC FORCE MICROSCOPE AND METHOD FOR IMAGING SURFACES WITH ATOMIC RESOLUTION
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Patent #:
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Issue Dt:
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04/10/1990
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Application #:
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07297059
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Filing Dt:
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01/13/1989
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Title:
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MICROCASTING OF MICROMINIATURE TIPS
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Patent #:
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Issue Dt:
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07/24/1990
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Application #:
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07297770
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Filing Dt:
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01/17/1989
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Title:
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MICROMINIATURE CANTILEVER STYLUS
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Patent #:
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Issue Dt:
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05/28/1991
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Application #:
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07327863
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Filing Dt:
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03/23/1989
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Title:
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HIGH SPEED WAVEFORM SAMPLING WITH A TUNNELING MICROSCOPE
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Patent #:
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Issue Dt:
|
11/06/1990
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Application #:
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07368580
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Filing Dt:
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06/20/1989
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Title:
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MICROFABRICATED CANTILEVER STYLUS WITH INTEGRATED CONICAL TIP
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Patent #:
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Issue Dt:
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02/12/1991
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Application #:
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07386330
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Filing Dt:
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07/27/1989
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Title:
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NEAR-FIELD LORENTZ FORCE MICROSCOPY
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Patent #:
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Issue Dt:
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01/15/1991
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Application #:
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07391908
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Filing Dt:
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08/10/1989
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Title:
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SPIN-POLARIZED SCANNING TUNNELING MICROSCOPE
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Patent #:
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Issue Dt:
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08/27/1991
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Application #:
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07421207
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Filing Dt:
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10/13/1989
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Title:
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DISTANCE-CONTROLLED TUNNELING TRANSDUCER
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Patent #:
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Issue Dt:
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04/02/1991
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Application #:
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07424377
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Filing Dt:
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10/20/1989
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Title:
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ATOMIC PHOTO-ABSORPTION FORCE MICROSCOPE
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Patent #:
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Issue Dt:
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11/19/1991
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Application #:
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07427788
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Filing Dt:
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10/27/1989
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Title:
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NITRIDE CANTILEVERS WITH SINGLE CRYSTAL SILICON TIPS
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Patent #:
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Issue Dt:
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06/04/1991
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Application #:
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07429415
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Filing Dt:
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10/31/1989
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Title:
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MICROCANTILEVER WITH INTEGRAL SELF-ALIGNED SHARP TETRAHEDRAL TIP
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|
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Patent #:
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|
Issue Dt:
|
02/12/1991
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Application #:
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07454677
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Filing Dt:
|
12/21/1989
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Title:
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ELECTRICAL PROBE INCORPORATING SCANNING PROXIMITY MICROSCOPE
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|
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Patent #:
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|
Issue Dt:
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11/12/1991
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Application #:
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07499857
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Filing Dt:
|
03/27/1990
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Title:
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SCANNING CAPACITANCE - VOLTAGE MICROSCOPY
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|
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Patent #:
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|
Issue Dt:
|
05/26/1992
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Application #:
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07568286
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Filing Dt:
|
08/16/1990
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Title:
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METHOD OF PRODUCING MICROMECHANICAL SENSORS FOR THE AFM/STM PROFILOMETRY
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|
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Patent #:
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|
Issue Dt:
|
09/24/1991
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Application #:
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07568306
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Filing Dt:
|
08/16/1990
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Title:
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METHOD OF PRODUCING MICROMECHANICAL SENSORS FOR THE AFM/STM PROFILOMETRY AND MICROMECHANICAL AFM/STM SENSOR HEAD
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|
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Patent #:
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|
Issue Dt:
|
09/08/1992
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Application #:
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07588795
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Filing Dt:
|
09/27/1990
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Title:
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ATOMIC FORCE MICROSCOPY
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|
|
Patent #:
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|
Issue Dt:
|
06/22/1993
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Application #:
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07618054
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Filing Dt:
|
11/26/1990
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Title:
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METHOD OF FORMING MICROFABRICATED CANTILEVER STYLUS WITH INTEGRATED PRYMIDAL TIP
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|
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Patent #:
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|
Issue Dt:
|
10/20/1992
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Application #:
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07668886
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Filing Dt:
|
03/13/1991
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Title:
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SCANNING FORCE MICROSCOPE HAVING ALIGNING AND ADJUSTING MEANS
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|
|
Patent #:
|
|
Issue Dt:
|
05/11/1993
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Application #:
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07766656
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Filing Dt:
|
09/26/1991
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Title:
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SCANNING PROBE MICROSCOPE HAVING SCAN CORRECTION
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|
|
Patent #:
|
|
Issue Dt:
|
12/15/1992
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Application #:
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07770505
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Filing Dt:
|
10/03/1991
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Title:
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NANOMETER SCALE PROBE FOR AN ATOMIC FORCE MICROSCOPE, AND METHOD FOR MAKING SAME
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|
|
Patent #:
|
|
Issue Dt:
|
12/27/1994
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Application #:
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07850669
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Filing Dt:
|
03/13/1992
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Title:
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SCANNING PROBE MICROSCOPE
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|
|
Patent #:
|
|
Issue Dt:
|
09/05/1995
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Application #:
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07850677
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Filing Dt:
|
03/13/1992
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Title:
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OPTICAL SYSTEM FOR SCANNING MICROSCOPE
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|
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Patent #:
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|
Issue Dt:
|
09/13/1994
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Application #:
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07954695
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Filing Dt:
|
09/30/1992
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Title:
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ATOMIC FORCE MICROSCOPE HAVING CANTILEVER WITH PIEZORESISTIVE DEFLECTION SENSOR
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|
|
Patent #:
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|
Issue Dt:
|
01/10/1995
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Application #:
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07984891
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Filing Dt:
|
12/02/1992
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Title:
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SYSTEM AND METHOD OF MEASURING HIGH-SPEED ELECTRICAL WAVEFORMS USING FORCE MICROSCOPY AND OFFSET SAMPLING FREQUENCIES
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|
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Patent #:
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|
Issue Dt:
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08/22/1995
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Application #:
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08073201
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Filing Dt:
|
06/03/1993
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Title:
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PIEZPRESISTIVE CANTILEVER FOR SCANNING PROBE MICROSCOPE
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|
|
Patent #:
|
|
Issue Dt:
|
01/16/1996
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Application #:
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08238546
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Filing Dt:
|
05/05/1994
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Title:
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ATOMIC FORCE MICROSCOPE HAVING CANTILEVER WITH PIEZORESISTIVE DEFLECTION SENSOR
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|
|
Patent #:
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|
Issue Dt:
|
01/30/1996
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Application #:
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08313758
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Filing Dt:
|
09/28/1994
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Title:
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SYSTEM AND METHOD FOR HIGH-SPEED POTENTIOMETRY USING SCANNING PROBE MICROSCOPE
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|
|
Patent #:
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|
Issue Dt:
|
03/05/1996
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Application #:
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08320490
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Filing Dt:
|
10/11/1994
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Title:
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SCANNING PROBE MICROSCOPE
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|
|
Patent #:
|
|
Issue Dt:
|
05/20/1997
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Application #:
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08325997
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Filing Dt:
|
10/19/1994
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Title:
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SCANNING FORCE MICROSCOPE HAVING ALIGNING AND ADJUSTING MEANS
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|
|
Patent #:
|
|
Issue Dt:
|
01/21/1997
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Application #:
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08417485
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Filing Dt:
|
04/05/1995
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Title:
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METHOD OF FABRICATING CANTILEVER FOR ATOMIC FORCE MICROSCOPE HAVING PIEZORESISTIVE DEFLECTION DETECTOR
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|
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Patent #:
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|
Issue Dt:
|
04/28/1998
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Application #:
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08424960
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Filing Dt:
|
04/19/1995
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Title:
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PROCESS FOR TRANSFERRING MICROMINIATURE PATTERNS USING SPIN-ON GLASS RESIST MEDIA
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Patent #:
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Issue Dt:
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03/02/1999
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Application #:
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08428358
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Filing Dt:
|
04/21/1995
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Title:
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SCANNING PROBE MICROSCOPE HAVING A SINGLE VIEWING DEVICE FOR ON-AXIS AND OBLIQUE OPTICAL VIEWS
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|
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Patent #:
|
|
Issue Dt:
|
09/30/1997
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Application #:
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08448004
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Filing Dt:
|
05/23/1995
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Title:
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LARGE STAGE SYSTEM FOR SCANNING PROBE MICROSCOPES AND OTHER INSTRUMENTS
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