Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 013918/0833 | |
| Pages: | 2 |
| | Recorded: | 08/27/2003 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/01/2005
|
Application #:
|
10470847
|
Filing Dt:
|
08/27/2003
|
|
Publication #:
|
|
Pub Dt:
|
04/01/2004
| | | | |
|
Title:
|
ELECTRON BEAM DETECTOR, SCANNING TYPE ELECTRON MICROSCOPE, MASS SPECTROMETER, AND ION DETECTOR
|
|
|
Assignee
|
|
|
|
|
| 1126-1, ICHINO-CHO, HAMAMATSU-SHI |
| SHIZUOKA 435-8558, JAPAN |
|
|
Correspondence name and address
|
| |
OLIFF & BERRIDGE, PLC
|
| |
JAMES A. OLIFF
|
| |
P.O. BOX 19928
|
| |
ALEXANDRIA, VA 22320
|
Search Results as of:
05/31/2024 02:05 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
