Patent Assignment Details
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Reel/Frame: | 040145/0835 | |
| Pages: | 6 |
| | Recorded: | 09/26/2016 | | |
Attorney Dkt #: | 112572.69077US |
Conveyance: | CORRECTIVE ASSIGNMENT TO ADD THE OMITTED THIRD INVENTOR'S DATA PREVIOUSLY RECORDED ON REEL 039779 FRAME 0962. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/26/2017
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Application #:
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15039527
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Filing Dt:
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05/26/2016
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Publication #:
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Pub Dt:
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12/29/2016
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Title:
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Scanning Electron Microscope System, Pattern Measurement Method Using Same, and Scanning Electron Microscope
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Assignee
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24-14, NISHI-SHIMBASHI 1-CHOME |
MINATO-KU, TOKYO, JAPAN |
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Correspondence name and address
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CROWELL & MORING LLP
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1001 PENNSYLVANIA AVENUE NW
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WASHINGTON, DC 20004
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