Patent Assignment Details
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| Reel/Frame: | 006152/0844 | |
| Pages: | 2 |
| | Recorded: | 06/24/1992 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/10/1995
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Application #:
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07874889
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Filing Dt:
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04/28/1992
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Title:
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LSI WITH BUILT-IN TEST CIRCUIT AND TESTING METHOD THEREFOR
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Assignee
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| 72 HORIKAWA-CHO, SAIWAI-KU, KAWASAKI-SHI |
| KANAGAWA-KEN, JAPAN |
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Correspondence name and address
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FINNEGAN, HENDERSON, FARABOW,
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GARRETT & DUNNER
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DAVID W. HILL
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1300 I STREET, N.W.
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WASHINGTON, D.C. 20005-3315
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