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Reel/Frame:016001/0873   Pages: 2
Recorded: 05/12/2005
Attorney Dkt #:MSQP0002USA
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
12/09/2008
Application #:
10908440
Filing Dt:
05/12/2005
Publication #:
Pub Dt:
11/16/2006
Title:
METHOD FOR VALIDATING AN INTEGRATED CIRCUIT AND RELATED SEMICONDUCTOR PRODUCT THEREOF
Assignor
1
Exec Dt:
05/10/2005
Assignee
1
2F, NO. 56, YUANCYU 2ND RD., SCIENCE-BASED INDUSTRIAL PARK
HSINCHU, TAIWAN
Correspondence name and address
NORTH AMERICA INTERNATIONAL PATENT OFFIC
P.O. BOX 506
MERRIFIELD, VA 22116

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