Patent Assignment Details
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| Reel/Frame: | 008516/0878 | |
| Pages: | 3 |
| | Recorded: | 02/06/1997 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/28/1998
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Application #:
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08797515
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Filing Dt:
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02/06/1997
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Title:
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IMPEDANCE MATCHING CIRCUIT AND THIN FILM MEASURING PROBER
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Assignee
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| 2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO 100, JAPAN |
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Correspondence name and address
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LEYDIG, VOIT & MAYER
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JEFFREY A. WYAND
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SUITE 300
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700 THIRTEENTH STREET, N.W.
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WASHINGTON, D.C. 20005
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