Patent Assignment Details
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Reel/Frame: | 040344/0887 | |
| Pages: | 3 |
| | Recorded: | 11/16/2016 | | |
Attorney Dkt #: | 29936/39874A |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/24/2008
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Application #:
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11307515
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Filing Dt:
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02/10/2006
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Publication #:
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Pub Dt:
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06/08/2006
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Title:
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STRUCTURE AND METHOD FOR MEASURING THE CHANNEL BOOSTING VOLTAGE OF NAND FLASH MEMORY AT A NODE BETWEEN DRAIN/SOURCE SELECT TRANSISTOR AND ADJACENT FLASH MEMORY CELL
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Assignee
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SAN 136-1, AMI-RI, BUBAL-UEP |
KYUNGKI-DO |
ICHON-SHI, KOREA, REPUBLIC OF |
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Correspondence name and address
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MARSHALL GERSTEIN & BORUN LLP
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233 SOUTH WACKER DRIVE
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SUITE 6300
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CHICAGO, IL 60606
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