Patent Assignment Details
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Reel/Frame: | 011392/0893 | |
| Pages: | 3 |
| | Recorded: | 12/13/2000 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/31/2004
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Application #:
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09734737
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Filing Dt:
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12/13/2000
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Publication #:
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Pub Dt:
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06/28/2001
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Title:
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SUBSTRATE FILM THICKNESS MEASUREMENT METHOD, SUBSTRATE FILM THICKNESS MEASUREMENT APPARATUS AND SUBSTRATE PROCESSING APPARATUS
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Assignee
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11-1, HANEDA ASAHI-CHO, OHTA-KU |
TOKYO, JAPAN |
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Correspondence name and address
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WENDEROTH, LIND & PONACK, L.L.P.
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NILS E. PEDERSEN, ESQ.
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2033 K STREET, N.W.
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SUITE 800
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WASHINGTON, DC 20006
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