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Patent #:
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Issue Dt:
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05/18/2021
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Application #:
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16474499
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Filing Dt:
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06/27/2019
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Publication #:
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Pub Dt:
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11/14/2019
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Title:
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SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SCANNING ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
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09/06/2022
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Application #:
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16475567
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Filing Dt:
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07/02/2019
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Publication #:
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Pub Dt:
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05/06/2021
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Title:
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AUTOMATED ANALYZER AND LIQUID DISCHARGE METHOD FOR AUTOMATED ANALYZER
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Patent #:
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Issue Dt:
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12/20/2022
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Application #:
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16482106
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Filing Dt:
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07/30/2019
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Publication #:
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Pub Dt:
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07/16/2020
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Title:
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PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
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Patent #:
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Issue Dt:
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06/14/2022
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Application #:
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16482979
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Filing Dt:
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08/01/2019
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Publication #:
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Pub Dt:
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07/30/2020
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Title:
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AUTOMATED ANALYZER
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Patent #:
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Issue Dt:
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06/22/2021
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Application #:
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16486422
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Filing Dt:
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08/15/2019
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Publication #:
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Pub Dt:
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04/09/2020
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Title:
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MEASURING APPARATUS AND METHOD OF SETTING OBSERVATION CONDITION
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Patent #:
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Issue Dt:
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07/21/2020
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Application #:
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16487029
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Filing Dt:
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08/19/2019
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Publication #:
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Pub Dt:
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01/09/2020
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Title:
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AUTOMATED ANALYSIS DEVICE
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Patent #:
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Issue Dt:
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01/25/2022
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Application #:
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16488182
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Filing Dt:
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08/22/2019
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Publication #:
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Pub Dt:
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12/05/2019
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Title:
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AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
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Patent #:
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Issue Dt:
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03/15/2022
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Application #:
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16489838
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Filing Dt:
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08/29/2019
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Publication #:
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Pub Dt:
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01/02/2020
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Title:
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METHOD OF MANUFACTURING MAGNETIC TUNNEL JUNCTION AND MAGNETIC TUNNEL JUNCTION
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Patent #:
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Issue Dt:
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10/27/2020
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Application #:
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16491819
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Filing Dt:
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09/06/2019
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Publication #:
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Pub Dt:
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02/06/2020
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Title:
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CHARGED PARTICLE BEAM DEVICE
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Patent #:
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Issue Dt:
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08/10/2021
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Application #:
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16493697
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Filing Dt:
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09/12/2019
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Publication #:
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Pub Dt:
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01/30/2020
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Title:
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DEFECT OBSERVATION DEVICE AND DEFECT OBSERVATION METHOD
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16494437
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Filing Dt:
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09/16/2019
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Publication #:
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Pub Dt:
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11/18/2021
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Title:
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PLASMA PROCESSING APPARATUS
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Patent #:
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Issue Dt:
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12/22/2020
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Application #:
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16494454
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Filing Dt:
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09/16/2019
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Publication #:
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Pub Dt:
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01/16/2020
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Title:
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CHARGED-PARTICLE BEAM SYSTEM
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Patent #:
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NONE
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Issue Dt:
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11/22/2022
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Application #:
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16494477
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Filing Dt:
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09/16/2019
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Publication #:
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Pub Dt:
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01/16/2020
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Title:
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INSPECTION DEVICE
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Patent #:
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Issue Dt:
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03/15/2022
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Application #:
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16495366
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Filing Dt:
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09/18/2019
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Publication #:
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Pub Dt:
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11/25/2021
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Title:
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SUBSTRATE PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16495369
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Filing Dt:
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09/18/2019
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Publication #:
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Pub Dt:
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11/25/2021
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Title:
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PLASMA PROCESSING DEVICE AND METHOD FOR PROCESSING SAMPLE USING SAME
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Patent #:
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Issue Dt:
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11/29/2022
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Application #:
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16495515
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Filing Dt:
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09/19/2019
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Publication #:
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Pub Dt:
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11/18/2021
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Title:
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PLASMA ETCHING METHOD AND PLASMA PROCESSING APPARATUS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16495652
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Filing Dt:
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09/19/2019
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Publication #:
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Pub Dt:
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10/28/2021
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Title:
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DRY ETCHING APPARATUS AND DRY ETCHING METHOD
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Patent #:
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Issue Dt:
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09/27/2022
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Application #:
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16527520
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Filing Dt:
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07/31/2019
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Publication #:
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Pub Dt:
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02/06/2020
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Title:
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PLASMA PROCESSING METHOD AND PLASMA ASHING APPARATUS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16533273
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Filing Dt:
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08/06/2019
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Publication #:
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Pub Dt:
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02/27/2020
| | | | |
Title:
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STATE PREDICTION APPARATUS AND SEMICONDUCTOR MANUFACTURING APPARATUS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16561785
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Filing Dt:
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09/05/2019
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Publication #:
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Pub Dt:
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03/12/2020
| | | | |
Title:
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PLASMA PROCESSING DEVICE
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Patent #:
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Issue Dt:
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10/25/2022
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Application #:
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16563075
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Filing Dt:
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09/06/2019
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Publication #:
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Pub Dt:
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12/26/2019
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Title:
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PLASMA PROCESSING APPARATUS
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Patent #:
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Issue Dt:
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04/06/2021
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Application #:
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16567687
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Filing Dt:
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09/11/2019
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Publication #:
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Pub Dt:
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03/12/2020
| | | | |
Title:
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DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD FOR SEMICONDUCTOR WAFER
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Patent #:
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Issue Dt:
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03/24/2020
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Application #:
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16569161
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Filing Dt:
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09/12/2019
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Title:
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PLASMA PROCESSING APPARATUS
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Patent #:
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Issue Dt:
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02/22/2022
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Application #:
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16572873
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Filing Dt:
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09/17/2019
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Publication #:
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Pub Dt:
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04/02/2020
| | | | |
Title:
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CHARGED PARTICLE BEAM APPARATUS
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Patent #:
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|
Issue Dt:
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05/25/2021
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Application #:
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16572943
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Filing Dt:
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09/17/2019
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Publication #:
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Pub Dt:
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03/19/2020
| | | | |
Title:
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CHARGED PARTICLE BEAM SYSTEM
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Patent #:
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|
Issue Dt:
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01/26/2021
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Application #:
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16572999
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Filing Dt:
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09/17/2019
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Publication #:
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Pub Dt:
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03/19/2020
| | | | |
Title:
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CHARGED PARTICLE BEAM DEVICE
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Patent #:
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|
Issue Dt:
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11/09/2021
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Application #:
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16617319
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Filing Dt:
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11/26/2019
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Publication #:
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Pub Dt:
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04/29/2021
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Title:
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ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM, AND CONTROL METHOD OF ELECTRON BEAM OBSERVATION DEVICE
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Patent #:
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Issue Dt:
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05/09/2023
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Application #:
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16621405
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Filing Dt:
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12/11/2019
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Publication #:
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Pub Dt:
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04/02/2020
| | | | |
Title:
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CHROMATOGRAPHY MASS SPECTROMETRY AND CHROMATOGRAPH MASS SPECTROMETER
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Patent #:
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Issue Dt:
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08/03/2021
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Application #:
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16640443
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Filing Dt:
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02/20/2020
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Publication #:
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Pub Dt:
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09/10/2020
| | | | |
Title:
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PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD, AND ECR HEIGHT MONITOR
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Patent #:
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Issue Dt:
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02/02/2021
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Application #:
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16655497
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Filing Dt:
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10/17/2019
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Publication #:
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Pub Dt:
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02/13/2020
| | | | |
Title:
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SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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10/27/2020
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Application #:
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16661305
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Filing Dt:
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10/23/2019
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Publication #:
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Pub Dt:
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02/20/2020
| | | | |
Title:
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FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
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Patent #:
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Issue Dt:
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03/30/2021
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Application #:
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16665566
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Filing Dt:
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10/28/2019
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Publication #:
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Pub Dt:
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02/27/2020
| | | | |
Title:
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PLASMA PROCESSING APPARATUS
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