Patent Assignment Details
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| Reel/Frame: | 017270/0895 | |
| Pages: | 3 |
| | Recorded: | 02/17/2006 | | |
| Attorney Dkt #: | 021653-018800US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/08/2008
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Application #:
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11227182
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Filing Dt:
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09/14/2005
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Publication #:
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Pub Dt:
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03/15/2007
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Title:
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MULTIPLE POINT GATE OXIDE INTEGRITY TEST METHOD AND SYSTEM FOR THE MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUITS
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Assignee
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| 18 ZHANG JIANG ROAD, UPDONG NEW AREA |
| SHANGHAI, CHINA 201203 |
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Correspondence name and address
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KENT J. TOBIN
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TOWNSEND AND TOWNSEND AND CREW LLP
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TWO EMBARCADERO CENTER
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EIGHTH FLOOR
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SAN FRANCISCO, CA 94111-3834
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