Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 063573/0896 | |
| Pages: | 16 |
| | Recorded: | 05/08/2023 | | |
| Attorney Dkt #: | 34672 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
7
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Patent #:
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Issue Dt:
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11/03/2015
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Application #:
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13696054
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Filing Dt:
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11/02/2012
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Publication #:
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Pub Dt:
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02/28/2013
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Title:
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Normal Incidence Broadband Spectroscopic Polarimeter and Optical Measurement System
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Patent #:
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Issue Dt:
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07/01/2014
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Application #:
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13701698
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Filing Dt:
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12/03/2012
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Publication #:
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Pub Dt:
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03/21/2013
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Title:
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BROADBAND POLARIZATION SPECTROMETER WITH INCLINED INCIDENCE AND OPTICAL MEASUREMENT SYTEM
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Patent #:
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Issue Dt:
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10/27/2015
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Application #:
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14366637
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Filing Dt:
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06/18/2014
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Publication #:
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Pub Dt:
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12/04/2014
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Title:
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NORMAL-INCIDENCE BROADBAND SPECTROSCOPIC POLARIMETER CONTAINING REFERENCE BEAM AND OPTICAL MEASUREMENT SYSTEM
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Patent #:
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Issue Dt:
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11/30/2021
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Application #:
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16317007
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Filing Dt:
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01/10/2019
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Publication #:
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Pub Dt:
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10/17/2019
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Title:
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METHOD FOR CONDUCTING OPTICAL MEASUREMENT USINGFULL MUELLER MATRIX ELLIPSOMETER
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Patent #:
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Issue Dt:
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02/02/2021
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Application #:
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16317024
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Filing Dt:
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01/10/2019
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Publication #:
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Pub Dt:
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11/14/2019
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Title:
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APPARATUS AND METHOD FOR ONLINE AND REAL-TIME DETECTION OF TEMPERATURE OF EPITAXIAL WAFER
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Patent #:
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Issue Dt:
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08/04/2020
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Application #:
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16319322
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Filing Dt:
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01/19/2019
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Publication #:
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Pub Dt:
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05/30/2019
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Title:
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APPARATUS FOR AUTOMATICALLY AND QUICKLY DETECTING TWO-DIMENSIONAL MORPHOLOGY OF WAFER SUBSTRATE IN REAL TIME
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Patent #:
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Issue Dt:
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03/23/2021
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Application #:
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16319323
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Filing Dt:
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01/19/2019
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Publication #:
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Pub Dt:
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08/01/2019
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Title:
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SELF-CALIBRATION APPARATUS AND METHOD FOR REAL-TIME TEMPERATURE MEASUREMENT SYSTEM OF MOCVD DEVICE
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Assignee
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| B701, BUILDING 8, NO. 97 CHANGPING ROAD, SHAHE TOWN, CHANGPING DISTRICT |
| BEIJING, CHINA 102206 |
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Correspondence name and address
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PLATINUM INTELLECTUAL PROPERTY PC
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3031 TISCH WAY, STE 110 PW
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SAN JOSE, CA 95128
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