Patent Assignment Details
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| Reel/Frame: | 042407/0898 | |
| Pages: | 14 |
| | Recorded: | 05/17/2017 | | |
| Attorney Dkt #: | 8836S-1202 (IH-260603-US) |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/23/2019
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Application #:
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15597262
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Filing Dt:
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05/17/2017
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Publication #:
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Pub Dt:
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02/22/2018
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Title:
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METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR PERFORMING THE SAME, AND A METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
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Assignee
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| 129, SAMSUNG-RO, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16677 |
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Correspondence name and address
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F. CHAU & ASSOCIATES, LLC
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130 WOODBURY ROAD
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WOODBURY, NY 11797
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