Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 003905/0906 | |
| Pages: | 1 |
| | Recorded: | 08/03/1981 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
08/09/1983
|
Application #:
|
06289199
|
Filing Dt:
|
08/03/1981
|
Title:
|
METHOD AND APPARATUS FOR MEASURING A GAP DISTANCE BETWEEN A MASK AND A WAFER TO BE USED IN FABRICATION OF SEMICONDUCTOR INTEGRATED CIRCUITS
|
|
Assignee
|
|
|
2381-1, OHARA, KITAGEJYO, |
FUJII-MACHI, NIRASAKI-SHI, A CORP.OF JAPAN |
YAMANASHI-KEN, JAPAN |
|
Correspondence name and address
|
|
PRICE, HENEVELD, HUIZENGA & COOPER
|
|
5740 FOREMOST DRIVE, S.E.
|
|
P.O. BOX 2567
|
|
GRAND RAPIDS, MI 49501
|
Search Results as of:
05/26/2024 02:01 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|