Patent Assignment Details
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| Reel/Frame: | 004744/0915 | |
| Pages: | 2 |
| | Recorded: | 08/10/1987 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/08/1989
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Application #:
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07051888
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Filing Dt:
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05/18/1987
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Title:
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METHOD AND PROCESS FOR TESTING THE RELIABILITY OF INTEGRATED CIRCUIT (IC) CHIPS AND NOVEL IC CIRCUITRY FOR ACCOMPLISHING SAME
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Assignee
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| A CORP. OF CA |
| PALO ALTO, CALIFORNIA |
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Correspondence name and address
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LEGAL DEPARTMENT 20B0
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HEWLETT-PACKARD COMPANY
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3000 HANOVER STREET
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PALO ALTO, CALIFORNIA 94304
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