Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 016570/0926 | |
| Pages: | 3 |
| | Recorded: | 07/28/2005 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
7
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Patent #:
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Issue Dt:
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04/28/1998
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Application #:
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08621888
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Filing Dt:
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03/26/1996
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Title:
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DNA BASE SEQUENCER
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Patent #:
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Issue Dt:
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05/11/1999
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Application #:
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08629266
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Filing Dt:
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04/08/1996
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Title:
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INSPECTION METHOD AND DEVICE OF WAFER SURFACE
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Patent #:
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Issue Dt:
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07/01/1997
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Application #:
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08678069
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Filing Dt:
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07/10/1996
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Title:
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EXTRANEOUS SUBSTANCE INSPECTION METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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03/03/1998
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Application #:
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08736582
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Filing Dt:
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10/24/1996
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Title:
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EXTRANEOUS SUBSTANCE INSPECTION APPARATUS FOR PATTERNED WAFER
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Patent #:
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Issue Dt:
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10/06/1998
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Application #:
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08744454
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Filing Dt:
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11/07/1996
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Title:
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EXTRANEOUS SUBSTANCE INSPECTION APPARATUS FOR PATTERNED WAFER
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Patent #:
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Issue Dt:
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12/02/1997
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Application #:
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08768553
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Filing Dt:
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12/18/1996
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Title:
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SURFACE INSPECTION METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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03/09/1999
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Application #:
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08898598
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Filing Dt:
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07/22/1997
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Title:
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SURFACE DEFECT INSPECTION DEVICE AND SHADING CORRECTION METHOD THEREFOR
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Assignee
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| 24-14, NISHI-SHINBASHI 1-CHOME |
| MINATO-KU, TOKYO 105-8717, JAPAN |
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Correspondence name and address
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JOHN R. MATTINGLY
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MATTINGLY, STANGER & MALUR ET AL.
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1800 DIAGONAL ROAD, SUITE 370
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ALEXANDRIA, VIRGINIA 22314
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