Patent Assignment Details
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| Reel/Frame: | 022623/0935 | |
| Pages: | 4 |
| | Recorded: | 04/30/2009 | | |
| Attorney Dkt #: | HE8256P |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/01/2011
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Application #:
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12433762
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Filing Dt:
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04/30/2009
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Publication #:
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Pub Dt:
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11/04/2010
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Title:
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METHOD FOR INSPECTING OVERLAY SHIFT DEFECT DURING SEMICONDUCTOR MANUFACTURING AND APPARATUS THEREOF
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Assignee
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| 5F, NO. 18, CREATION ROAD 1 |
| SCIENCE PARK |
| HSIN-CHU, TAIWAN 300 |
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Correspondence name and address
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STOUT, UXA, BUYAN & MULLINS LLP
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4 VENTURE, SUITE 300
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IRVINE, CA 92618
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