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Patent Assignment Details
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Reel/Frame:018797/0973   Pages: 4
Recorded: 01/25/2007
Attorney Dkt #:026661-003200US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 4
1
Patent #:
Issue Dt:
07/09/1991
Application #:
07354268
Filing Dt:
05/19/1989
Title:
CAD DRIVEN MICROPROBE INTEGRATED CIRCUIT TESTER
2
Patent #:
Issue Dt:
05/28/1991
Application #:
07527661
Filing Dt:
05/21/1990
Title:
CONTACT SENSING FOR INTEGRATED CIRCUIT TESTING
3
Patent #:
Issue Dt:
07/11/2000
Application #:
08994996
Filing Dt:
12/19/1997
Title:
A METHOD OF AUTOMATING THE MANIPULATION AND DISPLAY OF SETS OF WAFER YIELD DATA USING A USER INTERFACE SMART MACRO.
4
Patent #:
Issue Dt:
02/06/2001
Application #:
09192164
Filing Dt:
11/13/1998
Title:
IC TEST SOFTWARE SYSTEM FOR MAPPING LOGICAL FUNCTIONAL TEST DATA OF LOGIC INTEGRATED CIRCUITS TO PHYSICAL REPRESENTATION
Assignor
1
Exec Dt:
11/17/2006
Assignee
1
5460 BAYFRONT PLAZA
SANTA CLARA, CALIFORNIA 95054
Correspondence name and address
TOWNSEND AND TOWNSEND AND CREW LLP
2 EMBARCADERO CENTER, 8TH FLOOR
SAN FRANCISCO, CA 94111-3834

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