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Patent Assignment Details

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Reel/Frame:	066832/0987			Pages:	5
		Recorded:	03/20/2024
Attorney Dkt #:	FILMETRICS_ASSIGNMENT
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 13

Patent #:	7095511	Issue Dt:	08/22/2006	Application #:	09899383	Filing Dt:	07/03/2001
Publication #:	US20020030826	Pub Dt:	03/14/2002
Title:	METHOD AND APPARATUS FOR HIGH-SPEED THICKNESS MAPPING OF PATTERNED THIN FILMS

Patent #:	7233401	Issue Dt:	06/19/2007	Application #:	10625830	Filing Dt:	07/22/2003
Title:	METHOD AND APPARATUS FOR MEASURING THICKNESS OF A MATERIAL

Patent #:	7151609	Issue Dt:	12/19/2006	Application #:	11327222	Filing Dt:	01/07/2006
Publication #:	US20060164657	Pub Dt:	07/27/2006
Title:	DETERMINING WAFER ORIENTATION IN SPECTRAL IMAGING

Patent #:	7502119	Issue Dt:	03/10/2009	Application #:	11699262	Filing Dt:	01/29/2007
Publication #:	US20080180684	Pub Dt:	07/31/2008
Title:	THIN-FILM METROLOGY USING SPECTRAL REFLECTANCE WITH AN INTERMEDIATE IN-LINE REFERENCE

Patent #:	9019484	Issue Dt:	04/28/2015	Application #:	13253830	Filing Dt:	10/05/2011
Publication #:	US20120176604	Pub Dt:	07/12/2012
Title:	COMBINING NORMAL-INCIDENCE REFLECTANCE AND TRANSMITTANCE WITH NON-NORMAL-INCIDENCE REFLECTANCE FOR MODEL-FREE CHARACTERIZATION OF SINGLE-LAYER FILMS

Patent #:	8908177	Issue Dt:	12/09/2014	Application #:	13743038	Filing Dt:	01/16/2013
Publication #:	US20130258333	Pub Dt:	10/03/2013
Title:	CORRECTION OF SECOND-ORDER DIFFRACTION EFFECTS IN FIBER-OPTIC-BASED SPECTROMETERS

Patent #:	10247605	Issue Dt:	04/02/2019	Application #:	13743210	Filing Dt:	01/16/2013
Publication #:	US20130250294	Pub Dt:	09/26/2013
Title:	AUTOMATIC REAL-TIME WAVELENGTH CALIBRATION OF FIBER-OPTIC-BASED SPECTROMETERS

Patent #:	10571615	Issue Dt:	02/25/2020	Application #:	15178030	Filing Dt:	06/09/2016
Publication #:	US20160356938	Pub Dt:	12/08/2016
Title:	HIGH-LIFETIME BROADBAND LIGHT SOURCE FOR LOW-POWER APPLICATIONS

Patent #:	10724900	Issue Dt:	07/28/2020	Application #:	15273876	Filing Dt:	09/23/2016
Publication #:	US20170108377	Pub Dt:	04/20/2017
Title:	DETERMINING FOCUS CONDITION IN SPECTRAL REFLECTANCE SYSTEM

Patent #:	10620420	Issue Dt:	04/14/2020	Application #:	15273995	Filing Dt:	09/23/2016
Publication #:	US20170108688	Pub Dt:	04/20/2017
Title:	OPTICAL SYSTEM FOR USE WITH MICROSCOPE

Patent #:	10240981	Issue Dt:	03/26/2019	Application #:	15367715	Filing Dt:	12/02/2016
Publication #:	US20170160134	Pub Dt:	06/08/2017
Title:	OPTICAL SPECTROMETER CONFIGURATION INCLUDING SPATIALLY VARIABLE FILTER (SVF)

Patent #:	11099068	Issue Dt:	08/24/2021	Application #:	15448701	Filing Dt:	03/03/2017
Publication #:	US20170254641	Pub Dt:	09/07/2017
Title:	OPTICAL INSTRUMENTATION INCLUDING A SPATIALLY VARIABLE FILTER

Patent #:	10948284	Issue Dt:	03/16/2021	Application #:	16027317	Filing Dt:	07/04/2018
Title:	OPTICAL PROFILOMETER WITH COLOR OUTPUTS

Assignor

Exec Dt:

03/18/2024

Assignee

ONE TECHNOLOGY DR

MILPITAS, CALIFORNIA 95035

Correspondence name and address
	MR. JUSTIN DELOREAN SPURLOCK
	ONE TECHNOLOGY DR
	MILPITAS, CA 95035

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