Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 018442/0989 | |
| Pages: | 7 |
| | Recorded: | 10/30/2006 | | |
| Attorney Dkt #: | 122242.168919 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
7
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Patent #:
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Issue Dt:
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09/22/1998
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Application #:
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08783046
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Filing Dt:
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01/15/1997
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Title:
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METHOD AND DEVICE FOR MEASURING THE THICKNESS OF OPAQUE AND TRANSPARENT FILMS
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Patent #:
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Issue Dt:
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01/18/2000
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Application #:
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08885555
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Filing Dt:
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06/30/1997
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Title:
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METHOD AND APPARATUS FOR MEASURING MATERIAL PROPERTIES USING TRANSIENT-GRATING SPECTROSCOPY
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Patent #:
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Issue Dt:
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04/18/2000
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Application #:
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08885786
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Filing Dt:
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06/30/1997
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Title:
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METHOD AND DEVICE FOR MEASURING THE CONCENTRATION OF IONS IMPLANTED IN SEMICONDUCTOR MATERIALS
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Patent #:
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Issue Dt:
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09/12/2000
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Application #:
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08926850
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Filing Dt:
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09/10/1997
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Title:
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METHOD AND APPARATUS FOR MEASURING THE CONCENTRATION OF IONS IMPLANTED IN SEMICONDUCTOR MATERIALS
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Patent #:
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Issue Dt:
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07/03/2001
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Application #:
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09067411
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Filing Dt:
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04/27/1998
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Title:
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METHOD AND DEVICE FOR MEASURING THE THICKNESS OF THIN FILMS NEAR A SAMPLE'S EDGE AND IN A DAMASCENE-TYPE STRUCTURE
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Patent #:
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Issue Dt:
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05/30/2000
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Application #:
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09086975
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Filing Dt:
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05/28/1998
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Title:
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METHOD AND DEVICE FOR SIMULTANEOUSLY MEASURING THE THICKNESS OF MULTIPLE THIN METAL FILMS IN A MULTILAYER STRUCTURE
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Patent #:
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Issue Dt:
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09/21/2004
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Application #:
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09087141
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Filing Dt:
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05/28/1998
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Title:
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METHOD AND DEVICE FOR MEASURING THIN FILMS AND SEMICONDUCTOR SUBSTRATES
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Assignee
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| 12 MICHIGAN DRIVE |
| NATICK, MASSACHUSETTS 01760 |
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Correspondence name and address
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DANA BREITMAN
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599 LEXINGTON AVENUE
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GOODWIN PROCTER LLP
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NEW YORK, NY 10022
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