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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
08/28/2018
Application #:
14474304
Filing Dt:
09/02/2014
Publication #:
Pub Dt:
07/30/2015
Inventor:
Motoshi SETO
Title:
TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR CHIPS
Assignment: 1
Reel/Frame:
034994/0853Recorded: 02/20/2015Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/18/2014
Assignee:
1-1, SHIBAURA 1-CHOME, MINATO-KU
TOKYO, JAPAN 105-8001
Correspondent:
FREDERICK D. KIM
24 GREENWAY PLAZA, SUITE 1600
HOUSTON, TX 77046
Assignment: 2
Reel/Frame:
043194/0647Recorded: 07/14/2017Pages: 57
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/30/2017
Assignee:
1-1, SHIBAURA 1-CHOME, MINATO-KU
TOKYO, JAPAN 105-8001
Correspondent:
PATTERSON & SHERIDAN, LLP - TOSHIBA AMERICA
24 GREENWAY PLAZA, SUITE 1600
HOUSTON, TX 77046-2472

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