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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/23/2018
Application #:
15085241
Filing Dt:
03/30/2016
Inventors:
Jeremy Lee, Jayashree Saxena, Pramodchandran Variyam
Title:
DETERMINING TEST CONDITIONS FOR AT-SPEED TRANSITION DELAY FAULT TESTS ON SEMICONDUCTOR DEVICES
Assignment: 1
Reel/Frame:
038139/0937Recorded: 03/30/2016Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/23/2016
Exec Dt:
03/30/2016
Exec Dt:
03/23/2016
Assignee:
1845 SUMMIT AVE., STE. 407
PLANO, TEXAS 75074
Correspondent:
VARIYAM LAW FIRM, PLLC
3244 CARAVAN DRIVE
PLANO, TX 75025

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