Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/23/2018
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Application #:
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14942390
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Filing Dt:
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11/16/2015
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Publication #:
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Pub Dt:
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01/05/2017
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Inventors:
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Byeong-Heon Jeong, Jong Kil Oh, Taek-Soo Kim, Sanwi Kim, Bo Ki Hong, Kyung-Rim Jang
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Title:
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APPARATUS FOR MEASURING MICRO-CRACKS IN A MEMBRANE ELECTRODE ASSEMBLY AND METHOD FOR PREDICTING GENERATION OF MICRO-CRACKS IN THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 12, HEOLLEUNG-RO, SEOCHO-GU |
| SEOUL, KOREA, REPUBLIC OF 06797 |
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| 373-1, GUSEONG-DONG, YUSEONG-GU |
| DAEJEON, KOREA, REPUBLIC OF 305-701 |
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| MINTZ LEVIN |
| ONE FINANCIAL CENTER |
| BOSTON, MA 02111 |
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