Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/23/2018
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Application #:
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15478615
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Filing Dt:
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04/04/2017
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Publication #:
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Pub Dt:
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10/04/2018
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Inventors:
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Jeffrey A. West, David Leonard Larkin, Byron Lovell Williams, Weidong Tian
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Title:
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STRUCTURE AND METHOD FOR IMPROVING HIGH VOLTAGE BREAKDOWN RELIABILITY OF A MICROELECTRONIC DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 12500 TI BOULEVARD |
| M/S 3999 |
| DALLAS, TEXAS 75243 |
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| DANIEL CHAN |
| 12500 TI BOULEVARD |
| M/S 3999 |
| DALLAS, TX 75243 |
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