Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/13/2018
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Application #:
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15592628
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Filing Dt:
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05/11/2017
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Publication #:
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Pub Dt:
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11/15/2018
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Inventors:
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Clemens Ostermaier, Gerhard Prechtl, Juergen Bostjancic, Gerhard Raczynski et al
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Title:
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Semiconductor Probe Test Card with Integrated Hall Measurement Features
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SIEMENSSTRASSE 2 |
VILLACH, AUSTRIA 9500 |
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MURPHY, BILAK & HOMILLER/INFINEON TECHNO |
1255 CRESCENT GREEN |
SUITE 200 |
CARY, NC 27518 |
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09/25/2024 03:13 PM
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