Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/11/2018
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Application #:
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15161046
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Filing Dt:
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05/20/2016
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Publication #:
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Pub Dt:
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11/24/2016
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Inventors:
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Wen-Li WU, Yun-San Chien, Wei-En Fu, Shyh-Shin Ferng, Yi-Hung Lin
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Title:
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X-RAY REFLECTOMETRY APPARATUS FOR SAMPLES WITH A MINISCULE MEASUREMENT AREA AND A THICKNESS IN NANOMETERS AND METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 195, SEC. 4, CHUNG-HSING RD. |
| CHU-TUNG |
| HSINCHU, TAIWAN |
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| 8, LI-HSIN RD. VI |
| HSINCHU SCIENCE PARK |
| HSINCHU, TAIWAN 300-78 |
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| NIXON PEABODY, LLP |
| 70 W. MADISON STREET |
| SUITE 3500 |
| CHICAGO, IL 60602 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| BLDG.21, NO.195, SEC.4, CHUNG HSING RD., CHUTUNG, |
| HSINCHU, TAIWAN |
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| NO.8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK, |
| HSINCHU, TAIWAN 300-78 |
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| JCIPRNET |
| 8F-1, NO. 100, ROOSEVELT RD. SEC. 2, |
| TAIPEI, 100404 TAIWAN |
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