Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/10/2019
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Application #:
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15183253
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Filing Dt:
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06/15/2016
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Publication #:
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Pub Dt:
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12/21/2017
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Inventors:
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Yu-Jung CHANG, Wei-Kai LIAO, Ming-Ching LIN, Kuei-Hao TSENG
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Title:
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TESTING SYSTEM, METHOD FOR TESTING AN INTEGRATED CIRCUIT AND A CIRCUIT BOARD INCLUDING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 26 CHIN 3RD ROAD, NANTZE EXPORT PROCESSING ZONE |
| KAOHSIUNG, TAIWAN |
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| FOLEY & LARDNER LLP |
| 3000 K STREET, N.W. |
| SUITE 600 |
| WASHINGTON, DC 20007 |
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