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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
10/22/2019
Application #:
15994958
Filing Dt:
05/31/2018
Publication #:
Pub Dt:
06/06/2019
Inventors:
Paul A. DOYLE, Ryan Tsai, Morgan A. Crouch
Title:
LOCAL PURGE WITHIN METROLOGY AND INSPECTION SYSTEMS
Assignment: 1
Reel/Frame:
045957/0363Recorded: 05/31/2018Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/31/2018
Exec Dt:
05/31/2018
Exec Dt:
05/31/2018
Assignee:
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035-7418
Correspondent:
SILICON VALLEY PATENT GROUP LLP
4010 MOORPARK AVENUE
SUITE 210
SAN JOSE, CA 95117
Assignment: 2
Reel/Frame:
052544/0224Recorded: 04/30/2020Pages: 9
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/25/2019
Assignee:
16 JONSPIN ROAD
WILMINGTON, MASSACHUSETTS 01887
Correspondent:
ELENI ZACHARI
184 SHEPHERDS BUSH RD
LONDON, W67NL UNITED KINGDOM

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