Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/10/2019
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Application #:
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15725857
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Filing Dt:
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10/05/2017
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Publication #:
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Pub Dt:
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01/31/2019
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Inventors:
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Shyh-Shin Ferng, Chung-Li Huang, Yi-Hung Lin, Chungwei Wang
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Title:
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TEST KEY DESIGN TO ENABLE X-RAY SCATTEROMETRY MEASUREMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK |
| HSINCHU, TAIWAN 300-78 |
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| SLATER MATSIL, LLP |
| 17950 PRESTON RD., SUITE 1000 |
| DALLAS, TX 75252 |
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