Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/07/2020
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Application #:
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15744033
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Filing Dt:
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01/11/2018
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Publication #:
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Pub Dt:
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07/19/2018
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Inventors:
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Marc FAUCHER, Benjamin WALTER
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Title:
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COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCOPE INCLUDING SUCH A PROBE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| LABORATOIRE CENTRAL-CITE SCIENTIFIQUE |
| AVENUE POINCARE CS 60009 |
| VILLENEUVE D'ASCQ, FRANCE 59652 |
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| 3, RUE MICHEL ANGE |
| PARIS, FRANCE 75016 |
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| BAKER & HOSTETLER LLP |
| WASHINGTON SQUARE, SUITE 1100 |
| 1050 CONNECTICUT AVENUE, N.W. |
| WASHINGTON, DC 20036-5304 |
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