Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/21/2020
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Application #:
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14795793
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Filing Dt:
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07/09/2015
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Publication #:
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Pub Dt:
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01/12/2017
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Inventors:
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Uri Lev, Alon Litman, Zvi Nir, Arnon Mizrahy
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Title:
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SYSTEM AND METHOD FOR SCANNING AN OBJECT WITH AN ELECTRON BEAM USING OVERLAPPING SCANS AND ELECTRON BEAM COUNTER-DEFLECTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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9 OPPENHEIMER STREET, PARK RABIN |
REHOVOT, ISRAEL 76705 |
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KILPATRICK TOWNSEND & STOCKTON LLP |
TWO EMBARCADERO CENTER, EIGHTH FLOOR |
SAN FRANCISCO, CA 94111 |
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