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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/21/2020
Application #:
15948329
Filing Dt:
04/09/2018
Publication #:
Pub Dt:
08/23/2018
Inventor:
Wilhelmus Jacobus BASELMANS
Title:
Inspection Apparatus, Lithographic Apparatus and Method of Measuring a Property of a Substrate
Assignment: 1
Reel/Frame:
046277/0522Recorded: 07/06/2018Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/07/2008
Assignee:
DE RUN 6501
VELDHOVEN, NETHERLANDS NL - 5504 DR
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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