Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/30/2020
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Application #:
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16096443
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Filing Dt:
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10/25/2018
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Publication #:
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Pub Dt:
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05/16/2019
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Inventors:
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Tadaaki Kaneko, Koji Ashida
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Title:
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REFERENCE SAMPLE WITH INCLINED SUPPORT BASE, METHOD FOR EVALUATING SCANNING ELECTRON MICROSCOPE, AND METHOD FOR EVALUATING SIC SUBSTRATE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-155, UEGAHARA-ICHIBAN-CHO |
| NISHINOMIYA-SHI, HYOGO, JAPAN 6628501 |
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| WESTERMAN HATTORI DANIELS & ADRIAN LLP |
| 8500 LEESBURG PIKE, SUITE 7500 |
| TYSONS, VA 22182 |
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