Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/14/2020
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Application #:
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16559109
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Filing Dt:
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09/03/2019
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Publication #:
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Pub Dt:
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01/02/2020
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Inventors:
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Vijay Varadan, Pratyush Rai, Gyanesh Mathur
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Title:
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METHODS AND APPARATUS FOR HIGH THROUGHPUT SEM AND AFM FOR CHARACTERIZATION OF NANOSTRUCTURED SURFACES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 53 BOERUM PLACE |
| SUITE 3F |
| BROOKLYN, NEW YORK 11201 |
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| DAVIDSON, DAVIDSON & KAPPEL, LLC |
| 589 EIGHTH AVENUE |
| 16TH FLOOR |
| NEW YORK, NY 10018 |
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Assignment:
2
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SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
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| 111 W. CHURCH STREET |
| NASHVILLE, NORTH CAROLINA 27856 |
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| PERKY L. KARMIRE/SMITH ANDERSON LAW FIRM |
| 150 FAYETTEVILLE STREET |
| SUITE 2300 |
| RALEIGH, NC 27601 |
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