Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/15/2020
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Application #:
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15991651
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Filing Dt:
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05/29/2018
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Publication #:
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Pub Dt:
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12/05/2019
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Inventors:
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Chun-Jung HUANG, Yung-Lin HSU, Kuang-Huan HSU, Wei-Chih CHEN, Jen-Ti WANG, Chih-Hung LIU
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Title:
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FAULT DETECTION METHOD IN SEMICONDUCTOR FABRICATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NO. 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK |
HSINCHU, TAIWAN 300-78 |
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MCCLURE, QUALEY & RODACK, LLP |
3100 INTERSTATE NORTH CIRCLE |
SUITE 150 |
ATLANTA, GA 30339 |
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