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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
11022892
Issue Dt:
06/01/2021
Application #:
16669317
Filing Dt:
10/30/2019
Publication #:
20200064744
Pub Dt:
02/27/2020
Inventors:
Patrick WARNAAR, Simon Philip Spencer Hastings, Alberto Da Costa Assafrao et al
Title:
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
Assignment: 1
Reel/Frame:
054838/0165Recorded: 01/07/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
WARNAAR, PATRICK
Exec Dt:
03/07/2016
HASTINGS, SIMON PHILIP SPENCER
Exec Dt:
03/03/2016
DA COSTA ASSAFRAO, ALBERTO
Exec Dt:
03/03/2016
MACHT, LUKASZ JERZY
Exec Dt:
03/02/2016
Assignee:
ASML NETHERLANDS B.V.
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005
Assignment: 2
Reel/Frame:
054853/0161Recorded: 01/08/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
WARNAAR, PATRICK
Exec Dt:
03/07/2016
HASTINGS, SIMON PHILIP SPENCER
Exec Dt:
03/03/2016
DA COSTA ASSAFRAO, ALBERTO
Exec Dt:
03/03/2016
MACHT, LUKASZ JERZY
Exec Dt:
03/02/2016
Assignee:
ASML NETHERLANDS B.V.
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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