Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/03/2021
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Application #:
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15905110
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Filing Dt:
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02/26/2018
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Publication #:
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Pub Dt:
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09/13/2018
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Inventors:
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Abdellatif Zanati, Holger Mahnke
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Title:
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ATE TESTING SYSTEM AND METHOD FOR MILLIMETRE WAVE PACKAGED INTEGRATED CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 411 EAST PLUMERIA DRIVE, MS41 |
| SAN JOSE, CALIFORNIA 95134 |
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| NXP B.V. |
| 411 EAST PLUMERIA DRIVE, MS41 |
| SAN JOSE, CA 95134 |
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