Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/31/2021
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Application #:
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16349287
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Filing Dt:
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05/13/2019
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Publication #:
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Pub Dt:
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06/18/2020
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Inventors:
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GIL LOEWENTHAL, SHAY YOGEV, YOAV ETZIONI
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Title:
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LAYER DETECTION FOR HIGH ASPECT RATIO ETCH CONTROL
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| WEIZMANN SCIENCE PARK |
| P.O. BOX 266 |
| REHOVOT, ISRAEL 7610201 |
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| DANIEL J. SWIRSKY |
| 11 REUVEN STREET |
| BEIT SHEMESH, 9954419 ISRAEL |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| WEIZMANN SCIENTIFIC PARK |
| P.O. BOX 266 |
| REHOVOT, ISRAEL 7610201 |
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| RECHES PATENT |
| 211 NORTH UNION STREET, SUITE 100 |
| ALEXANDRIA, VA 22314 |
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