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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
11193975
Issue Dt:
12/07/2021
Application #:
16024722
Filing Dt:
06/29/2018
Publication #:
20200003836
Pub Dt:
01/02/2020
Inventors:
Christopher J. NELSON, Hiren V. TILALA, Sundar V. PATHY, Jared PAGER, Bradly INMAN et al
Title:
COMPRESSED TEST PATTERNS FOR A FIELD PROGRAMMABLE GATE ARRAY
Assignment: 1
Reel/Frame:
046634/0223Recorded: 07/26/2018Pages: 11
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
NELSON, CHRISTOPHER J.
Exec Dt:
07/19/2018
ROLLINS, SHELBY G.
Exec Dt:
07/25/2018
TILALA, HIREN V.
Exec Dt:
07/19/2018
HENDRICKS, MATTHEW
Exec Dt:
07/19/2018
PATHY, SUNDAR V.
Exec Dt:
07/19/2018
CALLAHAN, TIMOTHY J.
Exec Dt:
07/23/2018
PAGER, JARED
Exec Dt:
07/19/2018
NEEB, JAMES
Exec Dt:
07/19/2018
INMAN, BRADLY
Exec Dt:
07/19/2018
STURGES, STEPHEN
Exec Dt:
07/25/2018
Assignee:
INTEL CORPORATION
2200 MISSION COLLEGE BOULEVARD
SANTA CLARA, CALIFORNIA 95054
Correspondent:
SCHWABE, WILLIAMSON, & WYATT
1211 SW 5TH AVENUE
SUITE 1900
PORTLAND, OR 97204

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