Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/07/2022
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Application #:
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17094408
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Filing Dt:
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11/10/2020
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Publication #:
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Pub Dt:
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02/25/2021
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Inventors:
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Lin-Lin Chih, Chien-Hung Chen, Guan-Jhih Liou, Yu-Hsun Hsu
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Title:
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WAFER INSPECTION METHOD AND WAFER PROBING SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 155, CHUNG-HO STREET |
| CHU-PEI CITY, HSINCHU COUNTY, TAIWAN 302 |
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| BIRCH, STEWART, KOLASCH & BIRCH, LLP |
| 8110 GATEHOUSE ROAD |
| SUITE 100E |
| FALLS CHURCH, VA 22042 |
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