Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/02/2022
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Application #:
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16916091
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Filing Dt:
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06/29/2020
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Inventors:
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Chien-Huei Yang, Hua-Ming Wang, Syuan-Rong Huang, Chun-Fu Tung, Yung-Cheng Chang
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Title:
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SYSTEM AND METHOD FOR DETERMINING CAUSE OF ABNORMALITY IN SEMICONDUCTOR MANUFACTURING PROCESSES
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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123, PARK AVE-3RD, HSINCHU SCIENCE PARK |
HSINCHU, TAIWAN |
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WINSTON HSU |
5F., NO.389, FUHE RD., YONGHE DIST., |
NEW TAIPEI CITY, TAIWAN |
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