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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
11410830
Issue Dt:
08/09/2022
Application #:
16421004
Filing Dt:
05/23/2019
Inventors:
Hong Xiao, Lawrence Muray, Nick Petrone, John Gerling, Abdurrahman Sezginer et al
Title:
Defect Inspection and Review Using Transmissive Current Image of Charged Particle Beam System
Assignment: 1
Reel/Frame:
049751/0016Recorded: 07/15/2019Pages: 13
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
XIAO, HONG
Exec Dt:
06/05/2019
MURAY, LAWRENCE
Exec Dt:
06/01/2019
PETRONE, NICK
Exec Dt:
05/24/2019
GERLING, JOHN
Exec Dt:
06/03/2019
SEZGINER, ABDURRAHMAN
Exec Dt:
06/03/2019
BRODIE, ALAN D.
Exec Dt:
05/24/2019
VIRK, KULJIT
Exec Dt:
05/24/2019
ZHANG, QIANG Q.
Exec Dt:
06/03/2019
CHEN, GRACE HSIU-LING
Exec Dt:
07/03/2019
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299
Assignment: 2
Reel/Frame:
060435/0331Recorded: 06/23/2022Pages: 3
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
KLA-TENCOR CORPORATION
Exec Dt:
06/19/2019
Assignee:
KLA CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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